Semiconductor Inspection(nt) - メーカー・企業と製品の一覧

Semiconductor Testing [Contact Probes, IC Sockets, Probe Cards]

Support for inspection of various electronic components! Precision research of TOTAL TEST SOLUTION!

This is an introduction to Seiken Co., Ltd., which handles contact probes used for electrical testing, semiconductor wafer inspection probe cards, and IC sockets. We offer a lineup of products including "contact probes" that cater to both standard and special specifications, "IC sockets" that can be configured with housing materials suited to specific applications, and "probe cards" that accommodate various inspection conditions, including narrow pitch through fine processing technology. Examples of inspection conditions: - Support for narrow pitch (MIN P=80μ) - High current testing (pre-process testing of IGBT devices) - Non-magnetic testing (probes made from non-magnetic materials) Leveraging the technology we have cultivated over many years, we continue to develop solutions that provide a more efficient inspection environment and meet more detailed requests. An overview of our products is available in the documentation. [Contents] ■ Introduction ■ Product and technology introduction (Contact Probes) - Introduction of new product technology ■ Technology introduction (IC sockets, probe cards) ■ Other various products and services (precision processing, etc.) *For more details, please refer to the PDF document or feel free to contact us.

• 企業：精研 本社
• 価格：Other

• Other semiconductors